• DocumentCode
    516773
  • Title

    An Integrated High Performance Mixed Signal IF-to-Digital Converter

  • Author

    Bezzam, Ignatius ; Stoichita, Ion

  • Author_Institution
    Raytheon Semiconductor, Mountain View, California
  • fYear
    1996
  • fDate
    17-19 Sept. 1996
  • Firstpage
    240
  • Lastpage
    243
  • Abstract
    A single `chip´ IF-to-Digital converter sub-system containing Low Noise Amplifiers, AGC, down-conversion mixers, oscillators, baseband amplifiers, references and an A/D converte is presented. Mixed analog-digital circuit design and packaging techniques achieve a high level of integration using standard semiconductor processes. Measured results show that the IC can operate on IF signals between 30MHz-85MHz and decode transmissions up to 64QAM either in NTSC or PAL systems. Key performance factors include 63dB stable gain, 50dB IMD3, 40dB AGC range, 9dB input Noise Figure and 40Msps A/D conversion rate.
  • Keywords
    Analog-digital conversion; Baseband; Circuit synthesis; Integrated circuit measurements; Integrated circuit noise; Low-noise amplifiers; Oscillators; Semiconductor device measurement; Semiconductor device noise; Semiconductor device packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1996. ESSCIRC '96. Proceedings of the 22nd European
  • Conference_Location
    Neuchatel, Switzerland
  • Print_ISBN
    2-86332-197-8
  • Type

    conf

  • Filename
    5468636