Title :
An Integrated High Performance Mixed Signal IF-to-Digital Converter
Author :
Bezzam, Ignatius ; Stoichita, Ion
Author_Institution :
Raytheon Semiconductor, Mountain View, California
Abstract :
A single `chip´ IF-to-Digital converter sub-system containing Low Noise Amplifiers, AGC, down-conversion mixers, oscillators, baseband amplifiers, references and an A/D converte is presented. Mixed analog-digital circuit design and packaging techniques achieve a high level of integration using standard semiconductor processes. Measured results show that the IC can operate on IF signals between 30MHz-85MHz and decode transmissions up to 64QAM either in NTSC or PAL systems. Key performance factors include 63dB stable gain, 50dB IMD3, 40dB AGC range, 9dB input Noise Figure and 40Msps A/D conversion rate.
Keywords :
Analog-digital conversion; Baseband; Circuit synthesis; Integrated circuit measurements; Integrated circuit noise; Low-noise amplifiers; Oscillators; Semiconductor device measurement; Semiconductor device noise; Semiconductor device packaging;
Conference_Titel :
Solid-State Circuits Conference, 1996. ESSCIRC '96. Proceedings of the 22nd European
Conference_Location :
Neuchatel, Switzerland
Print_ISBN :
2-86332-197-8