• DocumentCode
    516846
  • Title

    A Totally Self-Checking CMOS ALU

  • Author

    Jückler, M. ; de Mahieu, S. ; Perotto, J.F. ; Trullemans, C.

  • Author_Institution
    Lab. de Microelectron., Univ. Catholique De Louvain, Louvain La Neuve, Belgium
  • fYear
    1982
  • fDate
    22-24 Sept. 1982
  • Firstpage
    98
  • Lastpage
    101
  • Abstract
    A totally self-checking ALU is presented in this paper. Design starts from a structure described in Mead and Conway [1], self-checking property is obtained with the aid of a specially-developed, topology-oriented, logical simulator.
  • Keywords
    CMOS logic circuits; logic design; logical simulator; self-checking CMOS ALU; topology-oriented; Built-in self-test; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Decoding; Electrical fault detection; Fault detection; Multiplexing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1982. ESSCIRC '82. Eighth European
  • Conference_Location
    Brussels
  • Type

    conf

  • Filename
    5468849
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=516846