Title :
A New Method for Improved Delay Characterization of VLSI Logic
Author :
Wagner, O. ; McLeod, M.H.
Author_Institution :
A. Vogel IBM Labs., Boeblingen, Germany
Abstract :
A new method is described which allows determination of Ton and Toff delays of logic gates on VLSI chips as function of load by frequency measurements, that means with automatic testsystems and computer aided evaluation.
Keywords :
VLSI; automatic test equipment; delay circuits; frequency measurement; logic gates; logic testing; VLSI logic; automatic test systems; computer aided evaluation; frequency measurement; improved delay characterization; logic gates; Automatic testing; Capacitance; Circuit testing; Delay; Equations; Frequency measurement; Logic circuits; Logic testing; Resistors; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference, 1982. ESSCIRC '82. Eighth European
Conference_Location :
Brussels
