Title :
A Couple of ECL Laser and Mask Programmable Logic Arrays
Author :
Barré, C. ; Bräckelmann, W. ; Koch, V. ; Kirbach, J.
Author_Institution :
Siemens A.G., Munchen
Abstract :
A high speed (3 ns typ.) laser customized programmable logic array and a compatible mask programmable logic array will be described. The organisation is 36 + 16 feedback × 48 × 16 with 16 flipflops offering serial scan diagnostic capability. They have ECL 100K logic levels and are packed in a 64 pin package. The FPLA has on chip self testing circuitry.
Keywords :
Automatic testing; Circuit testing; Laser feedback; Logic programming; Logic testing; Optical arrays; Optical coupling; Packaging; Programmable logic arrays; System testing;
Conference_Titel :
Solid-State Circuits Conference, 1983. ESSCIRC '83. Ninth European
Conference_Location :
Lausanne, Switzerland
Print_ISBN :
2-88074-021-5
