DocumentCode
516916
Title
Calculation and Measurement of the Sense Signal of Dynamic MOS RAMs
Author
Hofmann, R. ; Lindner, R. ; Wolfgang, E.
Author_Institution
Siemens AG, Munich, Germany
fYear
1979
fDate
18-21 Sept. 1979
Firstpage
107
Lastpage
109
Keywords
Capacitance; Charge transfer; Electron beams; MOS capacitors; Mechanical variables measurement; Probes; Sampling methods; Signal design; Time measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location
Southampton, UK
Print_ISBN
0-85296-208-8
Type
conf
Filename
5468930
Link To Document