Title :
Built-In Test for Complex Digital Integrated Circuits
Author :
Könemann, B. ; Mucha, J. ; Zwiehoff, G.
Author_Institution :
Technical University Aachen, Federal Republic of Germany
Abstract :
A method for testing the logic function of complex digital integrated circuits is presented. The method is based on built-in test. The extra hardware needed is kept minimal by functional conversion of already existing components (e.g. latches). The feasibility of the proposed method is demonstrated by results from both hardware and logic simulation.
Keywords :
Built-in self-test; Circuit faults; Circuit testing; Digital integrated circuits; Hardware; Integrated circuit testing; Latches; Logic circuits; Logic testing; Registers;
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8
