• DocumentCode
    516932
  • Title

    Cost Effective Semiconductor Memory Testing

  • Author

    Stevens, R.W. ; Brailsford, J.R.

  • Author_Institution
    International Computers Limited, Manchester
  • fYear
    1979
  • fDate
    18-21 Sept. 1979
  • Firstpage
    82
  • Lastpage
    85
  • Keywords
    Circuit testing; Computer industry; Costs; Crosstalk; Failure analysis; Large scale integration; Magnetic cores; Random access memory; Semiconductor device testing; Semiconductor memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference - ESSCIRC 79, Fifth European
  • Conference_Location
    Southampton, UK
  • Print_ISBN
    0-85296-208-8
  • Type

    conf

  • Filename
    5468946
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=516932