Title :
The Effect of Alpha-Particle-Induced Soft Errors on Memory Systems with Error Correction
Author :
Noorlag, D.J.W. ; Terman, L.M. ; Konheim, A.G.
Author_Institution :
Delft University of Technology, Delft, The Netherlands
Abstract :
Using Poisson statistics, a model for the survival probability of a memory system having both hard and soft error bit failure mechanisms is developed. Calculations are made over a range of soft error generation rates and erasure intervals for both single and double error correction.
Keywords :
Alpha particles; Atomic measurements; Error analysis; Error correction; Helium; MOSFET circuits; Neutrons; Probability; Production; Radioactive decay;
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8
