DocumentCode :
516935
Title :
Static Bipolar RAM Cell with Exponential Load Characteristic
Author :
Rydval, P. ; Kranzer, D.
Author_Institution :
Siemens AG, Munich
fYear :
1979
fDate :
18-21 Sept. 1979
Firstpage :
152
Lastpage :
154
Keywords :
Capacitance; Current measurement; Current-voltage characteristics; Equations; Page description languages; Random access memory; Resistors; Roentgenium; Schottky diodes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8
Type :
conf
Filename :
5468949
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=516935
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