Title :
Computer Aided Design of LSI : An I2L Case Study
Author :
Lincoln, C.P. ; Crispin, R.J.
Author_Institution :
Standard Telecommunication Laboratories, Harlow, England
Keywords :
Circuit simulation; Delay; Integrated circuit interconnections; Large scale integration; Layout; Logic circuits; Logic design; Logic gates; Logic testing; Telecommunication computing;
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8