Title :
An Integrated Electrothermal Amplitude Detector using the Seebeck Effect
Author :
Kerkhoff, H.G. ; Meyer, G.C.M.
Author_Institution :
Twente University of Technology, Delft University of Technology, Netherlands
Keywords :
Application specific integrated circuits; Detectors; Electrothermal effects; Resistors; Silicon; Temperature sensors; Thermal resistance; Thermal sensors; Thermoelectricity; Voltage;
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8
