DocumentCode
516976
Title
Testing Microprocessors
Author
Crichton, G.
Author_Institution
Siemens AG, Munich, Germany
fYear
1978
fDate
18-21 Sept. 1978
Firstpage
171
Lastpage
172
Abstract
The testability of microprocessors has become a very important question especially for device manufacturers. This paper discusses a test strategy for microprocessors where the internal logic is separated into 2 types: data-logic and control-logic. A practical example is presented in the form of a test program for the SAB 8080A microprocessor.
Keywords
integrated circuit manufacture; integrated circuit testing; microprocessor chips; control internal logic; data internal logic; microprocessor testing; Automatic control; Automatic testing; Clocks; Control systems; Decoding; Functional programming; Logic testing; Manufacturing; Microprocessors; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Circuits Conference - Digest of Technical Papers, 1978. ESSCIRC 78. 4th European
Conference_Location
Amsterdam
Type
conf
Filename
5469009
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