• DocumentCode
    516980
  • Title

    Grid Layout and Versatile Cells for Custom LSI Designers

  • Author

    Lusinchi, JP ; Redolfi, J.

  • Author_Institution
    Thomson-CSF Div., SESCOSEM, St. Egreve, France
  • fYear
    1978
  • fDate
    18-21 Sept. 1978
  • Firstpage
    160
  • Lastpage
    162
  • Abstract
    The association of versatile cells and coarse grid brings an efficient solution to the problem of designing performant custom LSI circuits. The CAD programs available allow direct wiring control, logical simulation as well as test pattern generation to ensure error free design of the final layout. This method has been successfully applied to TTL-LS technology.
  • Keywords
    CAD; automatic test pattern generation; integrated circuit layout; large scale integration; logic design; transistor-transistor logic; CAD; LSI circuits; TTL-LS technology; custom LSI designers; direct wiring control; error free design; grid layout; logical simulation; test pattern generation; versatile cells; Circuit simulation; Circuit testing; Design automation; Design engineering; Large scale integration; Libraries; Logic testing; Metallization; Schottky diodes; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference - Digest of Technical Papers, 1978. ESSCIRC 78. 4th European
  • Conference_Location
    Amsterdam
  • Type

    conf

  • Filename
    5469013