Title :
Grid Layout and Versatile Cells for Custom LSI Designers
Author :
Lusinchi, JP ; Redolfi, J.
Author_Institution :
Thomson-CSF Div., SESCOSEM, St. Egreve, France
Abstract :
The association of versatile cells and coarse grid brings an efficient solution to the problem of designing performant custom LSI circuits. The CAD programs available allow direct wiring control, logical simulation as well as test pattern generation to ensure error free design of the final layout. This method has been successfully applied to TTL-LS technology.
Keywords :
CAD; automatic test pattern generation; integrated circuit layout; large scale integration; logic design; transistor-transistor logic; CAD; LSI circuits; TTL-LS technology; custom LSI designers; direct wiring control; error free design; grid layout; logical simulation; test pattern generation; versatile cells; Circuit simulation; Circuit testing; Design automation; Design engineering; Large scale integration; Libraries; Logic testing; Metallization; Schottky diodes; Wiring;
Conference_Titel :
Solid State Circuits Conference - Digest of Technical Papers, 1978. ESSCIRC 78. 4th European
Conference_Location :
Amsterdam
