DocumentCode :
517019
Title :
Micromachined Silicon Transducers for Measuring Force, Pressure, and Motion
Author :
Angell, J.B.
Author_Institution :
Electr. Eng. Dept., Stanford Univ., Stanford, CA, USA
fYear :
1978
fDate :
18-21 Sept. 1978
Firstpage :
33
Lastpage :
36
Abstract :
Integrated-circuit technology has provided the capability of defining very precise patterns on a silicon surface. When these patterns are used with advanced chemical etching techniques, well defined, very small structures can be formed from a silicon wafer, thereby suggesting a low-cost method of batch fabricating highly uniform, highly repeatable physical shapes. The combination of IC photolithography plus controlled etching of silicon has been labelled "micromachining," because of the inherent precision it provides. Certain kinds of silicon are highly piezoresistive, in that the resistivity changes very significantly with applied stress. Piezoresistors formed in such silicon enable us to convert mechanically induced stress into an electrical signal. Including piezoresistors into appropriate micromachined silicon shapes thus yields transducers for measuring such physical quantities as acceleration, pressure, and force, as will be described in this paper.
Keywords :
acceleration measurement; elemental semiconductors; etching; force measurement; integrated circuit technology; micromachining; motion measurement; photolithography; piezoresistive devices; pressure measurement; resistors; silicon; transducers; IC photolithography; Si; chemical etching technique; electrical signal; force measurement; integrated-circuit technology; mechanically induced stress; micromachined piezoresistive transducer; motion measurement; piezoresistive transducer; piezoresistor; pressure measurement; Accelerometers; Anisotropic magnetoresistance; Etching; Force measurement; Motion measurement; Pressure measurement; Resistors; Silicon; Stress; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference - Digest of Technical Papers, 1978. ESSCIRC 78. 4th European
Conference_Location :
Amsterdam
Type :
conf
Filename :
5469052
Link To Document :
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