Title :
Laser Testing of Integrated Circuits
Author :
Smith, J.G. ; Oldham, H.E.
Author_Institution :
Dept. of Electron., Univ. of Southampton, Southampton, UK
Abstract :
A laser beam is used to inject data at MHz rates into internal circuit nodes of an integrated circuit, reducing the time required for device testing and fault location.
Keywords :
fault location; integrated circuit testing; laser beam applications; MHz rates; University; device testing; fault location; inject data; integrated circuits; internal circuit nodes; laser testing; Circuit faults; Circuit testing; Fault diagnosis; Integrated circuit testing; Laser beams; Laser feedback; Laser theory; Lasers and electrooptics; Power lasers; Silicon;
Conference_Titel :
Solid State Circuits Conference, 1976. ESSCIRC 76. 2nd European
Conference_Location :
Toulouse
