Title :
Fault Detection Problems and their Impact on the Design of Digital Circuits
Author :
Diaz, M. ; Courvoisier, M. ; Geffroy, J.C.
Author_Institution :
Lab. d´ Austomatique et d´Anal. des Syst., Tuolouse, France
Abstract :
This communication presents the principal methods for detecting faults in logical structures. As a consequence of their limitations (size of the structures) methods for modifying the circuits in order to obtain easily testable and/or self-checking systems are given.
Keywords :
fault diagnosis; logic circuits; logic design; digital circuit design; fault detection problems; logical structures; self-checking systems; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Logic testing; Sequential analysis; System testing;
Conference_Titel :
Solid State Circuits Conference, 1976. ESSCIRC 76. 2nd European
Conference_Location :
Toulouse
