Title :
Objectives for Integrated Circuit Tolerance Design
Author_Institution :
Univ. of London King´´s Coll., London, UK
Abstract :
The objectives of statistical tolerance design are established in relation to the practical design situation for large integrated circuits.
Keywords :
fault tolerance; integrated circuit design; integrated circuit tolerance design; large integrated circuit; statistical tolerance design; Circuit analysis computing; Educational institutions; Equations; Filters; Integrated circuit measurements; Integrated circuit yield; Moment methods; Sampling methods; Tolerance analysis; Yield estimation;
Conference_Titel :
Solid State Circuits Conference, 1976. ESSCIRC 76. 2nd European
Conference_Location :
Toulouse
