Title :
100-Element Resistive MOS-gated Line Scanner
Author :
Whelan, M V ; de Groot, J G
Keywords :
Earth; Electrodes; Electron devices; Geometry; Laboratories; MOSFETs; Silicon; Solid modeling; Switches; Voltage;
Conference_Titel :
Solid State Circuits Conference (ESSCIRC), 1975 First European
Conference_Location :
Canterbury, UK
Print_ISBN :
0-85296-149-9
