Title :
DC Analysis of Non-Linear Circuits using Solution Tracing Circuits
Author_Institution :
LSI Division. Semiconductor Business Headquarters., SANYO Electric Co., Ltd., 180, Sakata Oizumi-machi, Ora-gun, Gunma-ken, 370-05 Japan
Abstract :
A practical method of analyzing multi-valued DC characteristic curves of non-linear circuits is proposed. In this method, the characteristic curves can easily be traced by executing TRAN analysis with a conventional general-purpose circuit simulator. Some numerical examples including a bipolar analog 1C are also presented to demonstrate the effectiveness of this method.
Keywords :
Bandwidth; Capacitors; Chirp modulation; Circuit analysis; Delay effects; Frequency modulation; Linearity; Switching circuits; Threshold voltage; Voltage-controlled oscillators;
Conference_Titel :
Solid-State Circuits Conference, 1991. ESSCIRC '91. Proceedings - Seventeenth European
Conference_Location :
Milan, Italy
