DocumentCode

517096

Title

A Proposal for Detecting Degradation in Logic Circuits by Counting Errors Induced by Gaussian Noise

Author

Ager, D.J. ; Mylotte, P.S.

Author_Institution

Post Office Research Centre

fYear

1975

fDate

2-5 Sept. 1975

Firstpage

85

Lastpage

86

Keywords

Circuit noise; Circuit testing; Degradation; Earth; Error analysis; Gaussian noise; Logic circuits; Noise measurement; Proposals; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid State Circuits Conference (ESSCIRC), 1975 First European

Conference_Location

Canterbury, UK

Print_ISBN

0-85296-149-9

Type

conf

Filename

5469148