DocumentCode
517119
Title
Investigations on High-Resolution Imaging with Three-Terminal CID´s
Author
Koch, Rudolf
Author_Institution
Res. Labs., Siemens AG, Munich, Germany
fYear
1976
fDate
21-24 Sept. 1976
Firstpage
28
Lastpage
29
Abstract
The suitability of 3T-CIDs for high resolution imaging was investigated on a special device. Two different integrating readout techniques, giving low fixed pattern noise, were successfully tested.
Keywords
charge injection; readout electronics; charge injection device; high resolution imaging; integrating readout techniques; low fixed pattern noise; three terminal CID; Capacitance; Clocks; Electrodes; Fabrication; Feedback; High-resolution imaging; Laboratories; Signal to noise ratio; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Circuits Conference, 1976. ESSCIRC 76. 2nd European
Conference_Location
Toulouse
Type
conf
Filename
5469241
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