Title :
Investigations on High-Resolution Imaging with Three-Terminal CID´s
Author_Institution :
Res. Labs., Siemens AG, Munich, Germany
Abstract :
The suitability of 3T-CIDs for high resolution imaging was investigated on a special device. Two different integrating readout techniques, giving low fixed pattern noise, were successfully tested.
Keywords :
charge injection; readout electronics; charge injection device; high resolution imaging; integrating readout techniques; low fixed pattern noise; three terminal CID; Capacitance; Clocks; Electrodes; Fabrication; Feedback; High-resolution imaging; Laboratories; Signal to noise ratio; Testing; Voltage;
Conference_Titel :
Solid State Circuits Conference, 1976. ESSCIRC 76. 2nd European
Conference_Location :
Toulouse
