Title :
Characterization of CCD Technology on 64 Ã\x97 128 Element Photosensor
Author :
Berger, J.L. ; Thenoz, Y ; Woehrn, D
Keywords :
Aluminum; Charge coupled devices; Circuits; Frequency; Insulation; Optical arrays; Phased arrays; Registers; Silicon; Voltage;
Conference_Titel :
Solid State Circuits Conference (ESSCIRC), 1975 First European
Conference_Location :
Canterbury, UK
Print_ISBN :
0-85296-149-9
