Title :
Smart Temperature Sensor with Integrated Bitstream Calibration
Author :
van der Horn, Gert ; Huijsing, Johan H.
Author_Institution :
Electronic Instrumentation Laboratory / DIMES, Technical University Delft, Mekelweg 4, 2628 CD Delft, The Netherlands. Phone +31.15.786518, Fax +31.15.785755
Abstract :
A novel sensor calibration technique has been applied for temperature measurements with an inaccuracy of 0.1% of the full scale. A PTAT and bandgap reference circuit and a sigma-delta AD converter have been integrated on the same chip together with digital calibration circuitry. The digital output can be calibrated for offset, gain, and 2nd-order non-linearity errors for an arbitrary temperature range in between ¿40°C and 125°C.
Keywords :
Bipolar transistors; Calibration; Circuits; Delta-sigma modulation; Multiplexing; Photonic band gap; Signal generators; Temperature dependence; Temperature sensors; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European
Conference_Location :
Lille, France
Print_ISBN :
2-86332-180-3
