Title :
A Physical Analysis of the Operating Temperature Limits of Complementary M O S Transistor Integrated Circuits
Author :
Martinot, H ; Rossel, P. ; Vialaret, G ; Sarrabayrouse, G.
Keywords :
Ceramics; Diodes; Failure analysis; Integrated circuit packaging; Logic; MOSFETs; Performance analysis; Silicon; Temperature distribution; Thermal resistance;
Conference_Titel :
Solid State Circuits Conference (ESSCIRC), 1975 First European
Conference_Location :
Canterbury, UK
Print_ISBN :
0-85296-149-9