Title :
Implementation Constraints in Self-Checking Integrated Circuits
Author :
Crouzet, Y. ; Landrault, C.
Author_Institution :
Laboratoire d´´Automatique et d´´Analyse des Systÿmes du Centre National de la Recherche Scientifique, Toulouse, France
Abstract :
Summing up, we can say that the failures can be divided into three classes according to whether they induce single, unidirectional or multiple errors. Each of these three classes can also be divided into two groups : permanent and transient errors. The table of figure 2 gives for each class the main failures encountered.
Keywords :
Circuit faults; Computer aided manufacturing; Computer integrated manufacturing; Degradation; Fault tolerance; Fault tolerant systems; Integrated circuit manufacture; Pulp manufacturing; Threshold voltage; Very large scale integration;
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8
