DocumentCode :
517217
Title :
A Precision Active ´Current-Splitting´ Circuit Technique
Author :
Barker, R.W.J. ; Hart, B.L.
Author_Institution :
Sheffield University
fYear :
1975
fDate :
2-5 Sept. 1975
Firstpage :
54
Lastpage :
55
Keywords :
Availability; Circuit testing; Current measurement; Electrical resistance measurement; Flexible printed circuits; Instruments; Semiconductor device measurement; Semiconductor device testing; Semiconductor devices; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference (ESSCIRC), 1975 First European
Conference_Location :
Canterbury, UK
Print_ISBN :
0-85296-149-9
Type :
conf
Filename :
5469352
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=517217
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