Title :
High Reliability Circuits for Space Applications
Author_Institution :
Alcatel Espace, 26 avenue JF Champollion, BP 1187, F-31037 Toulouse. Tel: (33) 61 19 56 56, Fax: (33) 61 19 52 11
Abstract :
The aim of this contribution is to present and discuss a methodology for the Development/Design and the Reliability/Quality Assurance of advanced Application Specific Integrated Circuits for digital, analog and microwave space applications. Starting from the technical and managerial requirements of space projects, the presentation shows today´s procedure to fly advanced microelectronics. Areas of potential improvements or revisions are identified to reach an approach that would be more compatible with the fast technological and industrial evolutions in Space industry. Various activities of the Design/Developpement and Quality/Reliability Assurance are addressed and illustrated. Study cases are presented on reliability prediction, failure mode effects analyses, definition of safe operating conditions, process evaluation and parts selection. The presentation draws some conclusions about the technical and managerial trends.
Keywords :
Aerospace industry; Application specific integrated circuits; Failure analysis; Integrated circuit reliability; Integrated circuit technology; Microelectronics; Microwave theory and techniques; Project management; Quality assurance; Space technology;
Conference_Titel :
Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European
Conference_Location :
Lille, France
Print_ISBN :
2-86332-180-3