Title :
Design and Verification Strategies for Ensuring Long-Term Reliability of a 300-MHz Microprocessor
Author :
Preston, Ronald P. ; Bowhill, William J. ; Gronowski, Paul E. ; Mehta, Shekhar ; Fischer, Timothy C. ; Cvijetic, Radenko ; Lameré, Mare E. ; Badeau, Roy
Author_Institution :
Digital Equipment Corporation, 77 Reed Rd., Hudson, MA 01749, USA
Abstract :
A number of factors such as hot carrier degradation and electromigration affect the long-term reliability of high performance microprocessors. The complexity and high clock rates of modern chips require sophisticated verification strategies to ensure that the design meets all reliability requirements. Design methodologies employed on the 300 Mhz Alpha 21164 microprocessor to ensure long-term reliability are examined.
Keywords :
Clocks; Coupling circuits; Degradation; Design methodology; Driver circuits; Electromigration; Hot carriers; Integrated circuit interconnections; Microprocessors; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European
Conference_Location :
Lille, France
Print_ISBN :
2-86332-180-3
