Title :
Design for Testability of Analog-Digital System using Behavior Model
Author :
Zagursky, V. ; Karpov, A. ; Sirovatkina, M.
Author_Institution :
IECS, Latvian Academy of Sciences, 14 Dzerbenes str., LV-1006, Riga, Latvia.
Abstract :
The authors propose a design for testability of analog-digital systems (ADS). It is developed linear inertial heteroscedastic ADS model, that takes account of nonlinear and inertial conversion effects. The validity of the model is verified by actual measurements of the dynamic responses of a 14-bit analog-digital converter (ADC).
Keywords :
Analog-digital conversion; Design for testability; Frequency response; IEC; Nonlinear dynamical systems; Power system modeling; Quantization; Signal design; Signal to noise ratio; Stochastic resonance; analog-digital systems; behavioral model; design for testability; mixed signal system; stochastic models;
Conference_Titel :
Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European
Conference_Location :
Lille, France
Print_ISBN :
2-86332-180-3
