• DocumentCode
    517291
  • Title

    Characterizing energy efficiency of I/O intensive parallel applications on power-aware clusters

  • Author

    Ge, Rong ; Feng, Xizhou ; Subramanya, Sindhu ; Sun, Xian-He

  • Author_Institution
    Dept. of Math., Stat., & Comput. Sci., Marquette Univ., Milwaukee, WI, USA
  • fYear
    2010
  • fDate
    19-23 April 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Energy efficiency and parallel I/O performance have become two critical measures in high performance computing (HPC). However, there is little empirical data that characterize the energy-performance behaviors of parallel I/O workload. In this paper, we present a methodology to profile the performance, energy, and energy efficiency of parallel I/O access patterns and report our findings on the impacting factors of parallel I/O energy efficiency. Our study shows that choosing the right buffer size can change the energy-performance efficiency by up to 30 times. High spatial and temporal spacing can also lead to significant improvement in energy-performance efficiency (about 2X). We observe CPU frequency has a more complex impact, depending on the IO operations, spatial and temporal, and memory buffer size. The presented methodology and findings are useful for evaluating the energy efficiency of I/O intensive applications and for providing a guideline to develop energy efficient parallel I/O technology.
  • Keywords
    parallel processing; performance evaluation; I/O intensive parallel applications; high performance computing; parallel I/O access patterns; parallel I/O energy efficiency; power-aware clusters; Application software; Cloud computing; Computer science; Concurrent computing; Energy consumption; Energy efficiency; Frequency; High performance computing; Power engineering computing; Supercomputers; Energy efficiency; access pattern; parallel I/O;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel & Distributed Processing, Workshops and Phd Forum (IPDPSW), 2010 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-6533-0
  • Type

    conf

  • DOI
    10.1109/IPDPSW.2010.5470904
  • Filename
    5470904