• DocumentCode
    51756
  • Title

    Foreword for the Special Section on ESD CDM Tester, Modeling, and Characterization

  • Author

    Boselli, G.

  • Volume
    14
  • Issue
    3
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    791
  • Lastpage
    791
  • Abstract
    The three invited papers in this special section are extensions of original works presented at the 2013 EOS/ESD Symposium.
  • Keywords
    Electrostatic discharges; Meetings; Special issues and sections;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2014.2349741
  • Filename
    6889063
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=51756