• DocumentCode
    517827
  • Title

    Performance Analysis of NMOS for Higher Speed and Low Power Applications

  • Author

    Jha, Kamal Kishor ; Jain, Ankita ; Pattanaik, Manisha ; Srivastava, Anurag

  • Author_Institution
    VLSI Design Lab., ABV-IIITM Gwalior, Gwalior, India
  • fYear
    2010
  • fDate
    21-23 May 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Integrated circuits based on low supply voltage and subthreshold operations of NMOS devices are very attractive for low power applications. An effective way to reduce supply voltage and resulting in power consumption without losing the circuit performance of NMOS is to increase the drive current of NMOS. This paper reports the scaling analysis of NMOS from deep-submicron to nanometer technologies, in which channel length has been scaled down from 600nm to 90 nm. For simulation, ATLAS device simulator is used, by using the models LAMBARDI (CVT) mobility model and fixed Shockley-read-hall model recombination model. Simulation result depicts that threshold voltage is 0.26V at 600nm, 0.04V at 180nm and 0.01V at 90nm so nanometer range NMOS devices can be very attractive for low power and subthreshold operations.
  • Keywords
    MOS integrated circuits; low-power electronics; nanotechnology; power consumption; ATLAS device simulator; LAMBARDI mobility model; NMOS device; channel length; circuit performance; deep-submicron technology; drive current; fixed Shockley-read-hall model; integrated circuit; low power application; low supply voltage; nanometer technology; power consumption; scaling analysis; size 180 nm; size 600 nm; size 90 nm; subthreshold operation; voltage 0.01 V; voltage 0.04 V; voltage 0.26 V; CMOS technology; Capacitance; Circuit simulation; Energy consumption; MOS devices; Nanoscale devices; Performance analysis; Semiconductor device doping; Semiconductor process modeling; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future Information Technology (FutureTech), 2010 5th International Conference on
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4244-6948-2
  • Type

    conf

  • DOI
    10.1109/FUTURETECH.2010.5482680
  • Filename
    5482680