Title :
Notice of Retraction
Reliability assessment of the system subjected to sudden and multiclass gradual failures
Author :
Li ChangYou ; Xu MinQiang
Author_Institution :
Sch. of Mech. Eng. & Autom., Northeastern Univ., Shenyang, China
Abstract :
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
There are many systems which undergo not only sudden failure but also multiclass gradual failures simultaneously. This paper presents an approach to reliability assessment of these systems. Firstly, the system reliability model is given. The sudden failure time is assumed to follow the two-parameter Weibull distribution and the distribution is real-timely updated by the Bayesian estimation approach, and then the reliability model of the system subjected only to sudden failure is obtained. The deterioration of a variable leading to one class of gradual failure is described by a Gamma process and the parameters are real-timely updated by the Bayesian estimation approach, and then the reliability model of the system subjected only to one class of gradual failure is formulated. The results of the numerical example show that the proposed approach is effective for the reliability assessment of the system subjected to sudden and multiclass gradual failure simultaneously.
Keywords :
Bayes methods; Weibull distribution; estimation theory; reliability theory; Bayesian estimation approach; Gamma process; multiclass gradual failures; reliability assessment; sudden failure time; system reliability model; two-parameter Weibull distribution; Automation; Bayesian methods; Machinery; Mechanical engineering; Parameter estimation; Reliability; Space technology; Testing; Weibull distribution; Bayesian estimation; Gamma process; Weibull distribution; gradual failure; sudden failure; system reliability;
Conference_Titel :
Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6347-3
DOI :
10.1109/ICCET.2010.5485384