DocumentCode
518019
Title
Exploiting idle resources for reducing SER of microprocessor functional units
Author
Sun, Yan ; Li, Shaoqing ; Zhang, Minxuan ; Song, Chao
Author_Institution
Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
Volume
2
fYear
2010
fDate
16-18 April 2010
Abstract
Soft errors in combinational logic are becoming a serious problem for VLSI design. This paper presents an idle resources based SER reduction scheme for functional units of microprocessors. By exploiting unoccupied hardware and slack time in functional units, this technique reduces overheads of fault tolerance greatly. We combine C-element based error correction techniques with idle resources exploiting to enhance fault tolerance capability of functional units. The experiment results show that 94.36% of injected SETs can be corrected by proposed soft error correction scheme in average, while overheads of fault tolerance are significant low because idle resources are exploited adequately.
Keywords
VLSI; fault tolerant computing; integrated circuit design; integrated circuit reliability; microprocessor chips; C-element based error correction techniques; SER reduction scheme; VLSI design; combinational logic; fault tolerance; idle resources; microprocessor functional units; soft error correction scheme; Circuits; Clocks; Error analysis; Error correction; Error correction codes; Fault tolerance; Frequency; Logic; Microprocessors; Very large scale integration; functional unit; idle resource; reliability; soft error rate (SER);
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-6347-3
Type
conf
DOI
10.1109/ICCET.2010.5485453
Filename
5485453
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