• DocumentCode
    518019
  • Title

    Exploiting idle resources for reducing SER of microprocessor functional units

  • Author

    Sun, Yan ; Li, Shaoqing ; Zhang, Minxuan ; Song, Chao

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
  • Volume
    2
  • fYear
    2010
  • fDate
    16-18 April 2010
  • Abstract
    Soft errors in combinational logic are becoming a serious problem for VLSI design. This paper presents an idle resources based SER reduction scheme for functional units of microprocessors. By exploiting unoccupied hardware and slack time in functional units, this technique reduces overheads of fault tolerance greatly. We combine C-element based error correction techniques with idle resources exploiting to enhance fault tolerance capability of functional units. The experiment results show that 94.36% of injected SETs can be corrected by proposed soft error correction scheme in average, while overheads of fault tolerance are significant low because idle resources are exploited adequately.
  • Keywords
    VLSI; fault tolerant computing; integrated circuit design; integrated circuit reliability; microprocessor chips; C-element based error correction techniques; SER reduction scheme; VLSI design; combinational logic; fault tolerance; idle resources; microprocessor functional units; soft error correction scheme; Circuits; Clocks; Error analysis; Error correction; Error correction codes; Fault tolerance; Frequency; Logic; Microprocessors; Very large scale integration; functional unit; idle resource; reliability; soft error rate (SER);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-6347-3
  • Type

    conf

  • DOI
    10.1109/ICCET.2010.5485453
  • Filename
    5485453