DocumentCode :
518055
Title :
Estimating reflectance of halftone image printed on diffusing substrate by Markov chains
Author :
Liu, Zhen ; Zhang, Yan ; Wang, Kai
Author_Institution :
Printing & Packaging Dept. dept, Wuhan Univ., Wuhan, China
Volume :
2
fYear :
2010
fDate :
16-18 April 2010
Abstract :
We proposed a new spectral reflection prediction model that modified the classical Williams-Clapp.er model by considering the fact that the incident light entered into a given medium surface and exited from another medium, such as entered from colorant patch and exited from paper sheet. And the complex multiple reflection-transmission process occurring between different layers was described by Markov chain. Considering the transverse scatting influence of light propagated in the paper sheet, we introduced experience probability theory, then we calculated four fundamental transfer matrixes under different situation; finally, a new spectral reflectance model of halftone images based on the optical dot gain was established combined with Demichel equation.
Keywords :
Markov processes; image processing; Demichel equation; Markov chains; Williams-Clapper model; colorant patch; complex multiple reflection-transmission process; diffusing substrate; halftone image reflectance estimation; halftone images; incident light; optical dot gain; paper sheet; probability theory; spectral reflection prediction model; transfer matrixes; transverse scatting influence; Equations; Geometrical optics; Optical propagation; Optical reflection; Optical refraction; Optical scattering; Predictive models; Probability distribution; Reflectivity; Solid modeling; Markov chain; Williams-Clapper; halftone image diffusing substrate; spectral reflectance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6347-3
Type :
conf
DOI :
10.1109/ICCET.2010.5485531
Filename :
5485531
Link To Document :
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