DocumentCode :
518212
Title :
Wavelet entropy based no-reference quality prediction of distorted/decompressed images
Author :
De, Indrajit ; Sil, Jaya
Author_Institution :
MCKV Inst. of Eng., Howrah, India
Volume :
3
fYear :
2010
fDate :
16-18 April 2010
Abstract :
Assessing quality of distorted/decompressed images without reference to the original image is difficult due to vagueness in extracted features and complex relation between features and visual quality of images. The paper aims at assessing the quality of distorted/decompressed images without any reference to the original image by developing a fuzzy inference system (FIS). First level Haar approximation entropies of test images of LIVE database and the features extracted using the five Benchmark images are considered as antecedents while mean opinion score (MOS) based quality of the images are used as consequent to the proposed FIS. The crisp value of the features and quality of the images are expressed using linguistic variables, which are fuzzified to measure the vagueness in extracted features. Takagi-Sugeno-Kang (TSK) inference rule has been applied to the FIS to predict the quality of a new distorted/decompressed image. Quality of decompressed and various noise incorporated test images are predicted without reference to the original image producing output comparable with other no reference techniques. Results are validated with the objective and subjective image quality measures. Prediction characteristics are also evolved to verify the application of the proposed system in quality prediction.
Keywords :
data compression; distortion; feature extraction; fuzzy reasoning; image coding; wavelet transforms; LIVE database; Takagi-Sugeno-Kang inference rule; benchmark images; distorted-decompressed images; feature extraction; first level Haar approximation entropy; fuzzy inference system; image compression; image visual quality; linguistic variables; mean opinion score; no-reference quality prediction; quality assessment; test images; wavelet entropy; Benchmark testing; Distortion measurement; Entropy; Feature extraction; Fuzzy systems; Image databases; Image quality; Spatial databases; Takagi-Sugeno-Kang model; Visual databases; Fuzzy Systems; Gaussian Noise; Image Compression; MOS; Wavelet entropy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6347-3
Type :
conf
DOI :
10.1109/ICCET.2010.5485854
Filename :
5485854
Link To Document :
بازگشت