• DocumentCode
    518552
  • Title

    Modeling analysis of a tri-axial microaccelerometer with piezoelectric thin-film sensing using energy method

  • Author

    Yu, Jyh-Cheng ; Lee, Chungda ; Chang, Chiaokai ; Guo, Weinan

  • Author_Institution
    Nat. Kaohsiung First Univ. of Sci. & Technol., Kaohsiung, Taiwan
  • fYear
    2010
  • fDate
    5-7 May 2010
  • Firstpage
    79
  • Lastpage
    84
  • Abstract
    This study applies energy method to derive the system modeling of a tri-axial micro-accelerometer that consists of a quadri-beam suspension, a seismic mass, and displacement transducers using piezoelectric thin films. Two suspension beams support both ends of the seismic mass, which is fabricated by anisotropic etching of silicon. An out-of-plane acceleration will result in a symmetric bend, and in-plane accelerations will produce asymmetric bend and torsion of the suspension beams. Two piezoelectric thin-film transducers are arranged at both ends of each suspension and interconnected such that tri-axial accelerations can be measured selectively. The structure stiffness is derived from four laminated composite beams comprised of silicon substrates and piezoelectric films. The formulations of resonant frequencies and sensor sensitivities to tri-axial acceleration are presented and verified with finite element analysis.
  • Keywords
    accelerometers; finite element analysis; laminates; piezoelectric thin films; piezoelectric transducers; thin film sensors; anisotropic etching; displacement transducers; energy method; finite element analysis; in-plane accelerations; laminated composite beams; out-of-plane acceleration; piezoelectric thin film sensing; piezoelectric thin film transducer; quadribeam suspension; seismic mass; sensor sensitivities; tri-axial microaccelerometer; Acceleration; Anisotropic magnetoresistance; Etching; Modeling; Particle beams; Piezoelectric films; Piezoelectric transducers; Resonant frequency; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Test Integration and Packaging of MEMS/MOEMS (DTIP), 2010 Symposium on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4244-6636-8
  • Electronic_ISBN
    978-2-35500-011-9
  • Type

    conf

  • Filename
    5486476