• DocumentCode
    518577
  • Title

    Wafer-level glass capping with optical integration

  • Author

    Hansen, U. ; Maus, S. ; Leib, J. ; Toepper, M.

  • Author_Institution
    MSG Lithoglas AG, Berlin, Germany
  • fYear
    2010
  • fDate
    5-7 May 2010
  • Firstpage
    237
  • Lastpage
    241
  • Abstract
    A previously described wafer-level packaging (WLP) process allows quasi-hermetic capping of optical devices on wafer level yielding miniaturized glass cavity windows on top of the optical area - at the same time leaving the contact area accessible for standard electrical connections i.e. wire bond. This paper will focus on advancements in integrating coatings, apertures and three-dimensional lens-structures to achieve a functional integration of a packaging technology with optical qualities. The elevated requirements on the used technologies are discussed and shown on a manufactured demonstrator.
  • Keywords
    electronics packaging; optical devices; optical integration; packaging technology; quasi-hermetic capping; standard electrical connections; wafer level yielding miniaturized glass cavity windows; wafer-level glass capping; wafer-level packaging; Apertures; Coatings; Contacts; Glass; Integrated optics; Optical devices; Wafer bonding; Wafer scale integration; Windows; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Test Integration and Packaging of MEMS/MOEMS (DTIP), 2010 Symposium on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4244-6636-8
  • Electronic_ISBN
    978-2-35500-011-9
  • Type

    conf

  • Filename
    5486509