DocumentCode :
51890
Title :
Analytical and Experimental Study of Wide Tuning Range mm-Wave CMOS LC-VCOs
Author :
Elabd, S. ; Balasubramanian, S. ; Wu, Qingyao ; Quach, T. ; Mattamana, A. ; Khalil, Waleed
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
61
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
1343
Lastpage :
1354
Abstract :
The unprecedented interest in high bandwidth applications in the mm-wave range has set off a wave of research exploring techniques that enable wide tuning range voltage-controlled oscillators (VCOs). Low frequency CMOS LC-VCOs ( <;10 GHz) have been well studied in the literature and several approaches have been developed to optimize their performance. However, there lie several interesting challenges in the mm-wave space, specifically close to the fT/fmax, that motivate the need for analyzing the tuning range and phase noise in mm-wave VCOs. This paper presents a detailed analysis of the ultimate performance bound in simultaneously achieving low phase noise and wide tuning range in CMOS VCOs. The analysis is conducted on a 130 nm CMOS process, and confirmed by measurement results on three VCOs at 26 GHz, 34 GHz and 40 GHz. Finally, the impact of CMOS technology scaling (from 130 nm down to 45 nm), on the achievable performance bounds is analyzed and presented.
Keywords :
CMOS analogue integrated circuits; field effect MIMIC; millimetre wave oscillators; phase noise; voltage-controlled oscillators; frequency 26 GHz; frequency 34 GHz; frequency 40 GHz; low phase noise; size 130 nm; ultimate performance bound analysis; voltage-controlled oscillators; wide tuning range mm-wave CMOS LC-VCOs; CMOS integrated circuits; Capacitance; Inductors; Switches; Tuning; Varactors; Voltage-controlled oscillators; CMOS; LC-VCOs; mm-Wave VCOs; technology scaling; tuning range analysis; varactors; wide tuning range;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2014.2309862
Filename :
6778105
Link To Document :
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