• DocumentCode
    519120
  • Title

    A comparative analysis of behavioral simulation for third-order cascaded multi-bit Delta-Sigma modulator with interstage feedback paths

  • Author

    Amornwongpeeti, Sarayut ; Ekpanyapong, Mongkol ; Punyasai, Chumnarn

  • fYear
    2010
  • fDate
    19-21 May 2010
  • Firstpage
    371
  • Lastpage
    375
  • Abstract
    With the advance in semiconductor technology, the integration of digital and analog circuits on the same die becomes ubiquitous. The increasing demand of mixed signal integrated circuits drives the higher resolution for Digital-Analog circuits as well as Analog-Digital modulators. In this work, we perform a comprehensive analysis of an existing architecture of cascaded multi-bit Delta-Sigma Third-order modulator with interstage feedback paths using behavioral simulation. The model has been proofed mathematically in reducing the performance degradation by the DAC nonlinearity errors by Su and Chao. The contributions of this paper are as follows. First, we demonstrate that the DAC nonlinearity errors are the most prominent noise in the system based on the behavioral simulation. Second, the mathematical model is compared with the behavioral simulator for both ideal case (noises other than DAC noise are suppressed) and when other non-idealities are introduced. Finally, analysis effects of the DAC nonlinearity error parameters of each modulator stage are studied.
  • Keywords
    delta-sigma modulation; feedback; mixed analogue-digital integrated circuits; DAC nonlinearity errors; analog-digital modulators; behavioral simulation; cascaded multibit delta-sigma third-order modulator; comparative analysis; digital-analog circuits; interstage feedback paths; mathematical model; mixed signal integrated circuits; semiconductor technology; third-order cascaded multibit delta-sigma modulator; Analog circuits; Analytical models; Circuit simulation; Delta modulation; Feedback; Integrated circuit technology; Mathematical model; Mixed analog digital integrated circuits; Semiconductor device noise; Signal resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering/Electronics Computer Telecommunications and Information Technology (ECTI-CON), 2010 International Conference on
  • Conference_Location
    Chaing Mai
  • Print_ISBN
    978-1-4244-5606-2
  • Electronic_ISBN
    978-1-4244-5607-9
  • Type

    conf

  • Filename
    5491468