DocumentCode :
519499
Title :
The research of event-related potentials in working memory of the juvenile internet addiction
Author :
Xiong, Jianying ; Yao, Leiyue
Author_Institution :
Comput. Sci. Dept., Jiangxi Bluesky Univ., Nanchang, China
Volume :
1
fYear :
2010
fDate :
17-18 April 2010
Firstpage :
93
Lastpage :
95
Abstract :
Internet addiction disorder, as a form of technological addiction, will cause neurological complications, psychological disturbances, and relational chaos. Teenagers are in the most vulnerable age group, who will develop more serious complications than other age groups when addicted to the Internet. The objective of this study was to analyze the damage in working memory of the juvenile Internet addiction (IAD). The Chinese words Recognition is used as the experimental paradigms of event-related potentials (ERP). 13 normal teenagers and 10 Internet addiction received recognition task which use the old/new effects during Chinese words and the behavior data and electroencephalogram signals were recorded by the experiment equipment. After the data disposed, compared with the normal, both the ERP and the behavior data of the IAD have some obvious characteristics. The difference reveals the damage of the working memory from the neurophysiology.
Keywords :
Internet; bioelectric potentials; electroencephalography; human factors; medical disorders; medical signal processing; neurophysiology; psychology; Chinese word recognition; Internet addiction disorder; behavior data; electroencephalogram signal; event-related potential; juvenile Internet addiction; neurological complication; neurophysiology; psychological disturbance; technological addiction; teenager; working memory; Chaos; Computer science; Ecosystems; Electroencephalography; Enterprise resource planning; Frequency; IP networks; Internet; Magnetic field measurement; Psychology; Internet addiction; eventrelated potentials; working memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
E-Health Networking, Digital Ecosystems and Technologies (EDT), 2010 International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-5514-0
Type :
conf
DOI :
10.1109/EDT.2010.5496510
Filename :
5496510
Link To Document :
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