Title :
Selecting error patters based on symbol reliability for OSD algorithm
Author :
Zi-Jian, Dong ; Guo-Lei, Qiao
Author_Institution :
Sch. of Electron. Eng., Huaihai Inst. of Technol., Lianyungang, China
Abstract :
A new scheme of selecting error pattern is proposed. OSD algorithm processes certain MRIPs of a received sequence, performs bits flip among MRIPs, forms error patterns, and then generates candidate codeword. The bits flip is equal probability among MRIPs in OSD algorithms, which leads to too many candidates generated, and seriously affects the implement of algorithm. This paper proposes an improved algorithm which adopts unequal probability strategy utilizing the reliability of received symbols. The simulation results show that the proposed algorithm is effective. With little performance degradation, the computational complexity of algorithm can be reduced by 60% or more for one class of LDPC codes.
Keywords :
computational complexity; decoding; error statistics; parity check codes; probability; statistical analysis; LDPC codes; MRIP; OSD algorithm; bits flip; candidate codeword; computational complexity; equal probability; error patterns; performance degradation; probability strategy; received sequence; symbol reliability; Block codes; Computational complexity; Computational modeling; Degradation; Error analysis; Maximum likelihood decoding; Parity check codes; Probability; Reliability engineering; Statistics; error pattern; most reliable independent positions (MRIPs); ordered statistic decoding (OSD);
Conference_Titel :
Future Computer and Communication (ICFCC), 2010 2nd International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5821-9
DOI :
10.1109/ICFCC.2010.5497428