Title :
Reliability parameters of compound embedded systems
Author :
Sydor, Andriy ; Teslyuk, Vasyl
Author_Institution :
Automated Control Syst. Dept., Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
For unsymmetrical compound embedded systems ramified to level 2, reliability models are worked out for the cases when the lifetime of ageing output elements is circumscribed by the Rayleigh distribution. Main reliability parameters of compound embedded systems are examined in this paper.
Keywords :
embedded systems; micromechanical devices; reliability; Rayleigh distribution; reliability model; reliability parameters; unsymmetrical compound embedded system; Aging; Condition monitoring; Displays; Embedded system; Exponential distribution; Gaussian distribution; Inspection; Micromechanical devices; Preventive maintenance; Redundancy; Rayleigh distribution; embedded systems; generating functions; reliability parameters;
Conference_Titel :
Perspective Technologies and Methods in MEMS Design (MEMSTECH), 2010 Proceedings of VIth International Conference on
Conference_Location :
Lviv
Print_ISBN :
978-1-4244-7325-0
Electronic_ISBN :
978-966-2191-11-0
