Title :
Pattern silhouette features for image classification
Author :
Melnyk, Roman ; Kalychak, Yuriy
Author_Institution :
Software Dept., Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
The approach to find for visual pattern silhouette features as polynomial coefficients describing image properties is presented. It is suggested to use them for classification and image searching.
Keywords :
image classification; polynomials; image classification; image searching; pattern silhouette features; polynomial coefficients; Brightness; Feature extraction; Histograms; Image classification; Image databases; Image retrieval; Indexing; Polynomials; Spatial databases; Visual databases; approximation; polynomial function; silhouette; visual pattern;
Conference_Titel :
Perspective Technologies and Methods in MEMS Design (MEMSTECH), 2010 Proceedings of VIth International Conference on
Conference_Location :
Lviv
Print_ISBN :
978-1-4244-7325-0
Electronic_ISBN :
978-966-2191-11-0
