Title :
Full field spectral domain Optical Coherence Tomography with improved extended depth of focus
Author :
Zlotnik, Alex ; Abraham, Yoed ; Liraz, Lior ; Abdulhalim, Ibrahim ; Zalevsky, Zeev
Author_Institution :
Sch. of Eng., Bar Ilan Univ., Ramat-Gan, Israel
Abstract :
In Full field Optical Coherence Tomography (FFOCT) lateral resolution is achieved by high NA lenses. However, it decreases depth of focus (DOF). We incorporate interfering phase mask allowing to extend the DOF of a FFOCT.
Keywords :
optical images; optical tomography; full field spectral domain optical coherence tomography; interfering phase mask; lateral resolution; Focusing; Glass; Image resolution; Interference; Lenses; Light sources; Lighting; Optical imaging; Optical interferometry; Tomography;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
