Title :
Direct measurement of electron loss rate in air
Author :
Dogariu, Arthur ; Shneider, Mikhail N. ; Miles, Richard B.
Author_Institution :
Appl. Phys. Group, Princeton Univ., Princeton, NJ, USA
Abstract :
We present direct local measurements of electron attachment and recombination rates in atmospheric air. Using a microwave scattering based resonantly enhanced multi-photon ionization scheme we monitor the electron density dynamics with nanosecond resolution.
Keywords :
electron attachment; electron density; atmospheric air; direct measurement; electron attachment; electron density dynamics; electron loss rate; microwave scattering; nanosecond resolution; recombination rates; resonantly enhanced multiphoton ionization scheme; Atmospheric measurements; Electrons; Ionization; Loss measurement; Particle scattering; Plasma measurements; Pressure measurement; Radar scattering; Rayleigh scattering; Spontaneous emission;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
