Title :
Measuring and characterizing quantum states and processes
Author :
James, Daniel F V
Author_Institution :
Dept. of Phys., Univ. of Toronto, Toronto, ON, Canada
Abstract :
I will give an introductory overview of current experimental techniques used to characterize the density matrix of a system and the quantum process describing a device, with emphasis on applications in quantum optics.
Keywords :
quantum optics; quantum optics; quantum processes; quantum states; system density matrix; Density measurement; Frequency estimation; Optical devices; Optical polarization; Performance evaluation; Physics; Quantum computing; Quantum mechanics; State estimation; Tomography;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
