Title :
Characterization of SOI microrings using IR imaging
Author :
Cooper, Michael L. ; Gupta, Greeshma ; Park, Jung S. ; Schneider, Mark A. ; Divliansky, Ivan B. ; Mookherjea, Shayan
Author_Institution :
Univ. of California, La Jolla, CA, USA
Abstract :
We demonstrate a non-invasive diagnostic method of quantitative infrared (IR) imaging, applied here to a series cascade of microring resonators fabricated in silicon-on-insulator. The IR images contain information on the otherwise inaccessible individual through-ports and the resonators themselves, providing coupling, loss and intensity-enhancement parameters for the individual rings.
Keywords :
infrared imaging; optical waveguides; silicon-on-insulator; IR imaging; SOI microrings; microring resonators; quantitative infrared imaging; silicon-on-insulator; Cameras; Coupling circuits; Infrared imaging; Optical coupling; Optical fiber polarization; Optical fiber testing; Optical imaging; Optical resonators; Optical waveguides; Scanning electron microscopy;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
