• DocumentCode
    520637
  • Title

    Intrinsic laser-induced damage in bulk transparent dielectrics

  • Author

    Efimov, O.M.

  • Author_Institution
    HRL Labs., LLC, Malibu, CA, USA
  • fYear
    2010
  • fDate
    16-21 May 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Our results from experiments on laser-induced damage in transparent dielectrics are incompatible with the well-known avalanche ionization model. The mechanism of damage may involve a collective response of the dielectric, such as “dielectric-metal” phase transition.
  • Keywords
    Absorption; Dielectric materials; Dielectric measurements; Glass; Ionization; Laser modes; Laser transitions; Optical pulses; Pulse measurements; Solid lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    978-1-55752-890-2
  • Electronic_ISBN
    978-1-55752-890-2
  • Type

    conf

  • Filename
    5500225
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=520637