Title :
Domain inversion with 0.8µm period by Using a conductive AFM tip and its application to QPM-SHG devices
Author :
Minakata, Makoto ; Awano, Haruyuki ; Ohtsuka, Motohiro ; Iwata, Futoshi ; Taniuchi, Tetsuo
Author_Institution :
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
Abstract :
In this paper, we demonstrate a newly developed domain inversion technique using the improved AFM which is possible to scan a wide area through a conductive AFM tip, and also a thin LiNbO3 substrate called “a terrace substrate” using a dicing saw. Fine domain inversion period with less than 0.8μm is obtained. A novel SHG blue laser is also demonstrated using the terrace substrate and the extended AFM domain inversion technique.
Keywords :
atomic force microscopy; optical fabrication; optical harmonic generation; QPM-SHG Devices; conductive AFM tip; domain inversion; terrace substrate; Absorption; Blades; Glass; Laser beam cutting; Length measurement; Optical devices; Optical harmonic generation; Optical materials; Proposals; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
